ASE 2013: Entropy-based Test Generation for Improved Fault Localization

  • [PDF] J. Campos, R. Abreu, G. Fraser, and M. d’Amorim, “Entropy-based Test Generation for Improved Fault Localization,” in IEEE/ACM Int. Conference on Automated Software Engineering (ASE), 2013, pp. 257-267.
    [Bibtex] 
    @inproceedings{ase13_entropy,
    AUTHOR="Jose Campos and Rui Abreu and Gordon Fraser and Marcelo d'Amorim",
    TITLE="Entropy-based Test Generation for Improved Fault Localization",
    booktitle={IEEE/ACM Int. Conference on Automated Software Engineering (ASE)},
    pages={257--267},
    year={2013},
    organization={IEEE}
}